Jordan Valley is the world leader in X-ray metrology solutions for thin-film and in-line product wafer measurements. In addition to the JVX™ systems, our newly expanded product portfolio now includes the Bede metrology series. This comprehensive X-ray metrology family delivers unrivaled advantages in speed, precision and versatility, and
provides a single, cost-effective source for both front and back end metrology applications. Seventy five percent of the world's top 25 semiconductor manufacturers rely on Jordan Valley for a superior level of technology innovation and an unwavering commitment to customer support.